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PXI5396-FXT

PXI5396-FXT

  • Supports both structural JTAG / Boundary Scan Test and dynamic I/O operations
  • Programmable lock rate from 500Hz to 100MHz for the execution of functional tests in critical environments
  • Consists of a PXI supported Interface Module (IFM) and an offset Core Module (CM)
  • 96 single ended, voltage programmable I/O channels
  • Software supports IEEE 1445 Digital Test Interchange Format (DTIF)

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GOEPEL's JULIET JTAG/Boundary Scan tester and 3D Automated X-Ray Inspection (AXI) system OptiCon X-Line 3D are Test & Measurement World "Best in Test" finalists.
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