GOEPEL electronic wins 2012 Best in Test award
SCANFLEX TAP Transceiver SFX-TAP16/G wins the 2012 Best in Test award in the "Design for Test / Boundary Scan" category.
SFX-TAP16/G provides a flexible front end with per-TAP (test access port) exchangeable TAP Slot Cards (TSC), as well as integrated analog/digital resources and power-slot cards for the UUT (unit under test) power supply. With the ability to perform standard boundary-scan connectivity tests, in-system programming, processor-controlled test, and tests using chip-embedded instrumentation on 16 UUTs in parallel, the SFX-TAP16/G offers a modular solution for configuring stand-alone benchtop gang-test and gang-programming systems.
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