Design Guidelines
DFT guidelines for JTAG / boundary scan
Learn about design for test (DFT) guidelines to efficiently utilize IEEE 1149.1 / boundary scan and related test methodologies for board and system level test and device programming, including:
- Component selection,
- Layout of scan chains,
- Managing non-boundary scan circuitry,
- In-system programming performance considerations,
- Extended boundary-scan test coverage, and
- Things to consider when selecting a boundary-scan system.
Download JTAG / boundary scan DFT guidelines ...
Additional background information about JTAG / boundary scan and related technologies.
Design guidelines for automated optical and x-ray inspection
Design rules and guidelines can help to ensure that a product (PCB) can thoroughly and easily be tested with automated optical inspection.
Many AOI/AXI vendors have includes extra features and functions to provide testability even if design for inspection (DfI) guidelines have
not been followed closely.
Review design for automated optical and x-ray inspection guidelines ...
Additional background information about AOI / AXI.