IEEE Std 1149.7
The Mobile Industry Processor Interface (MIPI) Test and Debug Working group has selected a new test and debug interface,
called Compact JTAG (cJTAG), which builds upon the IEEE Std 1149.1 standard. The goal of cJTAG, standardized as IEEE Std 1149.7,
is to enable advancements in test and debug functionality while maintaining compatibility with IEEE Std 1149.1 by creating a superset
of the IEEE 1149.1 test interface.
A primary objective of cJTAG was to preserve the industry’s hardware and software investments in this standard.
With cJTAG, existing tools or Debug and Test Systems (DTS), such as an IEEE 1149.1 emulator, and Target System (TS) chips,
can simply be extended with adapters to convert to the cJTAG interface.
IEEE Std 1149.7 introduces six classes of compliant devices:
IEEE 1149.1 Extensions:
- Class T0: Assure IEEE Compliance for chips with multiple TAPs
- Class T1: Adding control functions (e.g. TAP power management, functional reset, etc.)
- Class T2: Adding performance features for series configurations
- Class T3: Adding performance features for star configurations
- Class T4: Adding two pin operation
- Class T5: Adding instruction/custom pin use to two pin operation
Send an inquiry via email
IEEE Std 1149.7 working group website