IEEE P1149.8.1
The "Selective Toggle" working group (originally dubbed "A-Toggle") is defining extensions
to IEEE Std 1149.1 that standardize the boundary-scan structures and methods for the test of
connections to passive and/or active components. The key feature of IEEE P1149.8.1 is a selective AC stimulus
generation that - when combined with non-contact signal sensing - will allow connectivity testing
between devices adhering to this standard and other devices (such as sockets, connectors, and ICs)
that do not provide IEEE Std 1149.1 features.
IEEE P1149.8,1 defines test structures both for single-ended and for differential pins. Since an AC stimulus on
a differential signal pair would cancel out in a no-fault situation, a capacitively coupled sensor would
not be able to detect a signal. P1149.8.1 proposes an unbalanced mode for differential drivers as a solution.
IEEE P1149.8.1 also specifies Boundary-Scan Description Language (BSDL) extensions to IEEE Std 1149.1 that
are to describe and support these new test structures.
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IEEE P1149.8.1 working group website