GOEPEL%20G



Learn about GOEPEL Electronics JTAG / boundary scan solutions

JTAG / boundary scan tools by GOEPEL electronics

What is JTAG / boundary scan?
Overview of JTAG / boundary scan tools offered by GOEPEL
Questions to consider when selecting JTAG / boundary scan tools and services

What is JTAG / boundary scan ?

    JTAG / boundary scan was the first test methodology to become an IEEE standard. The standard number is IEEE 1149.1 and its initial version was balloted on and approved in 1990. This standard defines features to be designed into an integrated circuit that provides access to its digital I/O pins from the inside of the device. This allows circuit nodes on the PCB to be accessed with device internal test features, rather than with a bed-of-nails fixture or with moving probes. (GOEPEL offers a software tool explaining IEEE 1149.1 features and their functions. It is available free of charge upon request.) With these built-in test features, boundary scan helps us to access circuit nodes that may not be accessible when using external physical access methods with probes. This is especially important when considering the wide use of high-density device packages and components with hidden solder joints (such as BGA, micro BGA, and so on). Boundary scan also has the potential to shorten time-to-market since it can be used very early in the product life cycle, potentially without the need for any bed-of-nails fixture or flying probes.

    Furthermore, boundary scan can be used throughout the whole product life cycle, since test vectors can be applied with very simple test equipment. Special circuitry to execute boundary scan tests can even be embedded on a Printed Circuit Assembly for use at the system level, for example as part of power-on self tests for systems out in the field. Boundary scan tests can be developed very rapidly and early in the design cycle, typically as soon as a schematic design of the UUT is available, even prior to having the layout of the PCB finished.

    The primary application, for which boundary scan was initially developed, was to detect and diagnose manufacturing defects related to connectivity at the board level, such as stuck-at-0 and stuck-at-1 faults, open solder joints, and shorted circuit nodes. Today, the test access port defined in IEEE 1149.1 is used for many additional applications, such as in-system programming, access to built-in self test, on-chip emulation and debug resources, and system level test.

    JTAG stands for Joint Test Action Group, which was a group of interested parties that set out to develop the test methodology that became IEEE 1149.1. Since then, many standard development efforts built on the original work by reusing features defined in 1149.1. One such standard is IEEE 1149.4, which defines device features supporting the test of analog circuits. Another example is IEEE 1149.6, which defines test resources used to verify AC-coupled networks, improving testability of technologies such as differential networks. IEEE 1532 defines in-system programming features accessible via the test access port defined in 1149.1, essentially providing a common method to program devices from different vendors. A number of additional standardization efforts related to JTAG / boundary scan have recently been completed (e.g. IEEE 1149.7, IEEE 1500) or are under way (e.g. IEEE P1149.8.1, IEEE P1581, IEEE P1687, SJTAG).

    GOEPEL can provide Design for Testability guidelines and even offers DFT analysis for boundary scan free of charge.
    We also offer a variety of seminars and training programs covering boundary scan technology and GOEPEL boundary scan tools. Seminars are offered as half day and full day events, training classes last from one day to four days, depending on the curriculum. Both seminars and training classes can be customized to cover specific topics and can be provided on-site for a corporate audience. We also offer web based training through webinars and conference calls.
For a schedule of upcoming webinars, seminars, and training classes, visit our events page. Or contact us to request further information.

[continue]

[back to top]

For details or to request a quote, please contact us.