GOEPEL Electronics               Intelligent Boundary Scan Solutions®           

JTAG / Boundary Scan Accessories

We offer a variety of Boundary Scan accessories for the SCANFLEX® hardware architecture and for the PXI platform.
Our UUT fixturing and probing tools simplify prototype debugging and are valuable during re-testing or in-depth debugging at repair stations.
GOEPEL also provides a variety of training and demo software and hardware tools.

PXI cards for Boundary Scan testing

PXI is a popular system platform in the test and measurement industry, featuring high data transfer rates and modularity in a small industrial footprint. PXI (PCI eXtensions for Instrumentation) is an open industry standard for modular measurement and automation systems. Based on - and compliant to - Compact-PCI, PXI combines the PCI-specification with new instrumentation specific features, taking advantage of the high performance and low cost of state-of-the-art PC technology. Based on the high-speed PCI bus, data rates up to 132MB/s are possible.

With innovative Boundary Scan Power Supplies, Digital I/O, Differential I/O, and Mixed Signal I/O PXI modules, GÖPEL electronic offers a complete range of PXI products for the integration in respective ATE systems, supporting Extended Boundary Scan operations in combination with various other test and programming methodologies. A complete PXI Product Guide can be downloaded here.


PXI Cards
PXI 5120
Power supply
  • operation in 3.3 V / 5 V PXI and cPCI racks;
  • two independent and galvanically isolated voltage outputs;
  • programmable current limit 0…10 A;
  • setting of output voltage and current limit via the host interface;
  • recording of output voltage, output current and overcurrent flag;
  • use of trigger signals for the event control;
  • interconnection of the C-bus via Trigger bus, Star trigger, Local bus, as well as external;
  • U/I read back and recording functions (1,024 samples);
  • thermal and overload protection;
  • IVI / VISA / LabVIEW s/w drivers;
  • variants:
    • 2 V version 0.5…2 V
    • 3 V version 1.2…3.3 V
    • 5 V version 2.5…5 V
    • 12 V version 5…12 V
    • 24 V version 11…24 V
    • 48 V version 23…48
  • Simple integration in PXI systems through preconfigured plug-ins
    (e.g. NI LabView, NI LabWindows, and NI TestStand);
  • Universal solutions for laboratory and production;
PXI 52192
Digital I/O
  • operation in PXITM and cPCITM racks;
  • 192 test channels;
  • all channels can be interconnected in HOT-SWAP mode – safe contacting is possible without PXI system being switched off;
  • the 192 test channels are subdivided into six groups with 32 channels each;
  • each group is programmable from 1.8 V to 5 V;
  • each channel is switchable as input, output or bi-directional pin, and is 5V tolerant;
  • driver current per channel: ±24 mA @ 5 V;
  • Unstress feature;
  • Preinstalled 50 pin cables (6 X 1m);
  • Simple integration in PXI systems through preconfigured plug-ins
    (e.g. NI LabView, NI LabWindows, and NI TestStand);
  • Universal solutions for laboratory and production;
PXI 5296
Digital I/O
  • operation in PXITM and cPCITM racks;
  • 96 test channels;
  • all channels can be interconnected in HOT-SWAP mode – safe contacting is possible without PXI system being switched off;
  • 96 test channels are subdivided into three groups with 32 channels each;
  • each group is programmable from 1.8 V to 5 V;
  • each channel is switchable as input, output or bi-directional pin, and 5 V tolerant;
  • driver current per channel: ±24 mA @ 5 V;
  • Unstress feature;
  • preinstalled 50 pin IDC cables (3 X 1m);
  • Simple integration in PXI systems through preconfigured plug-ins
    (e.g. NI LabView, NI LabWindows, and NI TestStand);
  • Universal solutions for laboratory and production;
PXI 5348
Differential I/O
  • operation in PXITM and cPCITM racks;
  • 48 differential test channels;
  • the PXI increment supports the following differential standards:
    • LVDS (24 inputs, 24 outputs),
    • BLVDS (48 bi-directional differential lines),
    • LVPECL (24 inputs, 24 outputs);
  • depending on the I/O-Standard each channel is input, output or bi-directional;
  • driver power per test channel is dependent on the selected I/O standard;
  • preinstalled 50 pin IDC cables (3 X 1m);
  • all data are transferred in parallel by means of the PXI interface;
  • Each configuration supports Boundary/JTAG Scan according to IEEE 1149.1, the test bus signals are supplied via PXI specific signals;
  • Simple integration in PXI systems through preconfigured plug-ins 
    (e.g. NI LabView, NI LabWindows, and NI TestStand);
  • Universal solutions for laboratory and production;
PXI 5350
Contact us for details.
PXI 5702
Mixed Signal I/O
  • two independent driver and sensor channels;
  • voltage range for digital control between -3 V and +9 V;
  • analogue voltage range for discrete voltage value output: -10 V...+10 V;
  • maximum output current static ±200 mA and dynamic ±380 mA;
  • back driving function dependent on the test bus states;
  • programmable current limit;
  • can be synchronised with the Boundary Scan controllers PXI 1149.1 A/B;
  • optimised for use with the Boundary Scan Prober or a manually handled probe;
  • Simple integration in PXI systems through preconfigured plug-ins 
    (e.g. NI LabView, NI LabWindows, and NI TestStand);
  • Universal solutions for laboratory and production;
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SCANFLEX® TAP Transceiver



Detailed specifications of the various SCANFLEX TAP Transceivers can be found on our SCANFLEX product page.

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SCANFLEX® I/O Modules


Detailed specifications of the various SCANFLEX I/O modules can be found on our SCANFLEX product page.

For detailed information about SCANFLEX please contact us.

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Fixturing and probing tools

For detailed specifications of the various fixturing and probing tools or for detailed information about any of the products listed above, please contact us.

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Training tools

Please contact us for detailed information about any of the training and demo tools listed above.

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