Glossary
A | B | C | D |
E | F | G | H |
I | J | K | L | M |
N | O | P | Q |
R | S | T | U |
V | W | X | Y |
Z
A
ABM - Analog Boundary Module
AC - Alternating Current
ADC - Analog to Digital Converter
AOI - Automated Optical Inspection
ASIC - Application-Specific Integrated Circuit
ATAP - Analog Test Access Port
ATE - Automated Test Equipment
AXI - Automated X-Ray Inspection
B
BGA - Ball-Grid Array
BERT - Bit Error Rate Test(er)
BIST - Built-In Self Test
BPR - Bypass Register
BSC - Boundary Scan Cell
BScan - Boundary Scan
BSR - Boundary Scan Register
BSDL - Boundary Scan Description Language
C
CAD - Computer Aided Design [Data]
CCA - Circuit Card Assembly
cJTAG - Compact JTAG
COB - Chip On Board
CPI - Central Processing Unit
CPLD - Complex PLD
D
DAC - Digital to Analog Converter
DC - Direct Current
DOF - Depth of Field
DR - Data Register
DRAM - Dynamic RAM
DSP - Digital Signal Processor
DTS - Debug and Test System
DUT - Device Under Test
E
EBST - Embedded Boundary Scan Test
EEPROM - Electrically Erasable Programmable Read-Only Memory
F
FCR - False Call Rate
FF - Flip-Flop
FIFO - First-In / First-Out [Memory]
FOV - Field of View
FPGA - Field-Programmable Gate Array
FPT - Flying Probe Test(er)
FT - Functional Test(er)
I
I2C - Inter-Integrated Circuit [Bus]
IEEE - Institute of Electrical and Electronics Engineers
IC - Integrated Circuit
ICE - In-Circuit Emulation
ICP - In-Circuit Programming
ICT - In-Circuit Test
I/F - Interface
IJTAG - Internal JTAG
I/O - Input/Output
IP - Intellectual Property
IR - Instruction Register
ISC - In-System Configuration
ISP - In-System Programming
J
Jam - Predecessor to STAPL
JTAG - Joint Test Action Group
L
LAN - Local Area Network
LASER - Light Amplification by Stimulated Emission of Radiation
LED - Light Emitting Diode
M
μC - Micro-Controller
LAN - Local Area Network
LIN - Local Interconnect Network
LXI - LAN Extensions for Instrumentation
MCM - Multi-Chip Module
MCU - Micro-Controller Unit
MDA - Manufacturing Defect Analyzer
μP - Micro-Processor
MP - Megapixel
μW - Micro-Wire [Bus/Protocol]
O
OCE - On-Chip Emulation
OCR - Optical Character Recognition
OCV - Optical Character Verification
OOI - Object of Interest
P
PCA - Printed Circuit Assembly
PCB - Printed Circuit Board
PCBA - Printed Circuit Board Assembly
PCI - Peripheral Component Interconnect
PLD - Programmable Logic Device
PWM - Pulse-Width Modulation
PXI - PXI Extensions for Instrumentation
Q
QFN - Quad Flat No leads (package)
R
RAM - Random Access Memory
S
SDRAM - Synchronous DRAM
SCITT - Static Component Interconnection Test Technology
SOC - System On Chip
SIP - System In Package
SJTAG - System JTAG
SPI - Serial Peripheral Interface [Bus]
SMD - Surface Mount Device
SMT - Surface Mount Technology
SPC - Statistical Process Control
SPI - Solder Paste Inspection
SRD - Scan Router Device
STAPL - Standard Test And Programming Language (Jedec Std. 71)
SVF - Serial Vector Format
T
TAP - Test Access Port
TBIC - Test Bus Interface Circuit
TCK - Test Clock
TDI - Test Data Input
TDO - Test Data Output
THT - Through-Hole Technology
TMS - Test Mode Select
TRST - Test Reset (low active)
U
USB - Universal Serial Bus
UUT - Unit Under Test
W
WLAN - Wireless LAN
X
XBST - External Boundary Scan Test