PXI5396-FXT

• Supports both structural JTAG / Boundary Scan Test and dynamic I/O operations
• Programmable lock rate from 500Hz to 100MHz for the execution of functional tests in critical environments
• Consists of a PXI supported Interface Module (IFM) and an offset Core Module (CM)
• 96 single ended, voltage programmable I/O channels
• Software supports IEEE 1445 Digital Test Interchange Format (DTIF)

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• Cooperation of SELEX and GOEPEL enables Boundary Scan and dynamic Functional Test in critical system environments
• Total Test Coverage by total Integration
• In-System Emulation Technology VarioTAP® supports latest Infineon® XC16x Processors
• SYSTEM CASCON™ features world’s first Automatic Program Generator for functional Emulation Test of Bus Components
• Universal Boundary Scan tester for production integrates test electronics directly in the fixture