SCANFLEX^® is a revolutionary new hardware platform, created to enable for extended Boundary Scan test and ISP solutions, taking full advantage of the technical potential provided by today’s and tomorrow’s standards. SCANFLEX excels when it comes to speed, flexibility, and modularity of a Boundary Scan test system. But it does not stop there, adding new capabilities for analog and mixed-signal test not found in competitive products. 

SCANFLEX^® systems are controlled through a JTAG / Boundary Scan Controller. This controller is responsible for simultaneous generation and dynamic distribution of serial patterns, parallel patterns, and control sequences, supporting three standard SFX and SFX/LS Interfaces. All SCANFLEX^® Controllers are available in three performance classes (A/B/C). Refer to the product matrix below.

As front-end, SCANFLEX^® systems use TAP-Transceiver modules. These modules are connected to the controller with the SFX cable (available in 2m/6ft, 5m/15ft, and 10m/33ft lengths). TAP Transceiver modules convert the data coming from the controller into respective operations of the built-in or added-on resources. TAP signals are provided through interchangeable TAP Interface Cards (TIC), allowing a nearly infinite range of front-end adaptations for various signal types, signal conditioning, and integration environments, including custom specific variants. 

The third major component in a SCANFLEX^® system is the optional I/O module, of which up to 31 can be combined in a test system. SCANFLEX I/O modules are available with a variety of test resources, with new types added to the SCANFLEX family continuously. Custom specific modifications of standard modules and development of custom modules are offered through GÖPEL electronic’s engineering services.

SCANFLEX^® Boundary Scan Controller:

• Available for PCI, PCI Express, USB, LAN/Ethernet, FireWire, PXI, and PXI Express;
• Compliant with IEEE1149.1, IEEE1149.4, IEEE1149.6, IEEE1532, JESD71 (STAPL), SVF (Serial Vector Format)
• Can be combined with all available SCANFLEX components (SFX TAP Transceivers, SFX I/O Modules);
• Full software support by JTAG/Boundary Scan development environment SYSTEM CASCON™;
• Guaranteed support of future advancements due to highly flexible, in-field re-programmable system hardware;
• Leading system architecture, based on specifically developed technologies (SPACE™, ADYCS™, HYSCAN™, FASTSCALE™);
• Test programs and ISP scripts are cross compatible with all Boundary Scan controllers from GÖPEL electronic;
• Applicable for standard Boundary Scan test, in-system programming (ISP) and in-system configuration (ISC);
• Supports Extended Boundary Scan operations in combination with various other test and programming methodologies;
• Fast and simple integration in Third Party ATE (Flying Prober, ICT, MDA, functional testers, …) as Boundary Scan option;

PCI Bus
SFX/PCI1149-A	TCK frequency range: DC up to 20MHz on 8 independent TAP’s, TCK step width 250Hz; Scan Data Buffer (TDI/TDO Cache); HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PCI specification revision 2.3; Universal solutions for laboratory and production;
SFX/PCI1149-B	TCK frequency range: DC up to 50MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PCI specification revision 2.3; Universal solutions for laboratory and production;
SFX/PCI1149-C	TCK frequency range: DC up to 80MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II-S scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PCI specification revision 2.3; Universal solutions for laboratory and production;
PCI Express Bus
SFX/PCIe1149-A	TCK frequency range: DC up to 20MHz on 8 independent TAP’s, TCK step width 250Hz; Scan Data Buffer (TDI/TDO Cache); HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PCI Express specification revision 1.0a; Integrated x1 interface with 264MB/s data throughput in zero wait state burst mode; Versatile solutions for laboratory and production;
SFX/PCIe1149-B	TCK frequency range: DC up to 50MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PCI Express specification revision 1.0a; Integrated x1 interface with 264MB/s data throughput in zero wait state burst mode; Versatile solutions for laboratory and production;
SFX/PCIe1149-C	TCK frequency range: DC up to 80MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II-S scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PCI Express specification revision 1.0a; Integrated x1 interface with 264MB/s data throughput in zero wait state burst mode; Versatile solutions for laboratory and production;
USB2.0 and FastEthernet Interface
SFX/USL1149-A	TCK frequency range: DC up to 20MHz on 8 independent TAP’s, TCK step width 250Hz; Scan Data Buffer (TDI/TDO Cache); HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with USB2.0 and Fast Ethernet (100Mb/s) with automatic port recognition; Supports USB On-The-GO (OTG), Hot Insertion, Plug and Play, as well as DHCP; Embedded operating system based on integrated 32 bit RISC processor allows perspective functional extensions; Portable, universal solutions for laboratory, production and service; Compact unit in metal housing, shipping with appropriate power supply as well as LAN and USB cables;
SFX/USL1149-B	TCK frequency range: DC up to 50MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with USB2.0 and Fast Ethernet (100Mb/s) with automatic port recognition; Supports USB On-The-GO (OTG), Hot Insertion, Plug and Play, as well as DHCP; Embedded operating system based on integrated 32 bit RISC processor allows perspective functional extensions; Portable, universal solutions for laboratory, production and service; Compact unit in metal housing, shipping with appropriate power supply as well as LAN and USB cables;
SFX/USL1149-C	TCK frequency range: DC up to 80MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II-S scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with USB2.0 and Fast Ethernet (100Mb/s) with automatic port recognition; Supports USB On-The-GO (OTG), Hot Insertion, Plug and Play, as well as DHCP; Embedded operating system based on integrated 32 bit RISC processor allows perspective functional extensions; Portable, universal solutions for laboratory, production and service; Compact unit in metal housing, shipping with appropriate power supply as well as LAN and USB cables;
USB2.0, FastEthernet, and FireWire Interface
SFX/TSL1149-A	TCK frequency range: DC up to 20MHz on 8 independent TAP’s, TCK step width 250Hz; Scan Data Buffer (TDI/TDO Cache); HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with USB2.0, Fast Ethernet (100Mb/s), and FireWire with automatic port recognition; Supports USB On-The-GO (OTG), Hot Insertion, Plug and Play, as well as DHCP; Embedded operating system based on integrated 32 bit RISC processor allows perspective functional extensions; Portable, universal solutions for laboratory, production and service; Compact unit in metal housing, shipping with appropriate power supply as well as LAN, USB, and FireWire cables;
SFX/TSL1149-B	TCK frequency range: DC up to 50MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with USB2.0, Fast Ethernet (100Mb/s), and FireWire with automatic port recognition; Supports USB On-The-GO (OTG), Hot Insertion, Plug and Play, as well as DHCP; Embedded operating system based on integrated 32 bit RISC processor allows perspective functional extensions; Portable, universal solutions for laboratory, production and service; Compact unit in metal housing, shipping with appropriate power supply as well as LAN, USB, and FireWire cables;
SFX/TSL1149-C	TCK frequency range: DC up to 80MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II-S scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with USB2.0, Fast Ethernet (100Mb/s), and FireWire with automatic port recognition; Supports USB On-The-GO (OTG), Hot Insertion, Plug and Play, as well as DHCP; Embedded operating system based on integrated 32 bit RISC processor allows perspective functional extensions; Portable, universal solutions for laboratory, production and service; Compact unit in metal housing, shipping with appropriate power supply as well as LAN, USB, and FireWire cables;
PXI Bus
SFX/PXI1149-A	TCK frequency range: DC up to 20MHz on 8 independent TAP’s, TCK step width 250Hz; Scan Data Buffer (TDI/TDO Cache); HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PXI specification revision 2.2; Provides Local Bus Interface and supports entire PXI Trigger Bus; Simple integration in PXI systems through preconfigured plug-ins (e.g. NI LabView, NI LabWindows, and NI TestStand); Universal solutions for laboratory and production;
SFX/PXI1149-B	TCK frequency range: DC up to 50MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PXI specification revision 2.2; Provides Local Bus Interface and supports entire PXI Trigger Bus; Simple integration in PXI systems through preconfigured plug-ins (e.g. NI LabView, NI LabWindows, and NI TestStand); Universal solutions for laboratory and production;
SFX/PXI1149-C	TCK frequency range: DC up to 80MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II-S scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PXI specification revision 2.2; Provides Local Bus Interface and supports entire PXI Trigger Bus; Simple integration in PXI systems through preconfigured plug-ins (e.g. NI LabView, NI LabWindows, and NI TestStand); Universal solutions for laboratory and production;
PXI Express Bus
SFX/PXIe1149-A	TCK frequency range: DC up to 20MHz on 8 independent TAP’s, TCK step width 250Hz; Scan Data Buffer (TDI/TDO Cache); HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PXI Express standard specification Revision 1.0; Integrated x1 Interface with 264MB/s data throughput in zero wait state burst mode; Provides PXI Express Local Bus Interface and supports entire PXI Trigger Bus; Simple integration in PXI Express systems through preconfigured plug-ins (e.g. NI LabView, NI LabWindows, and NI TestStand); Universal solutions for laboratory and production;
SFX/PXIe1149-B	TCK frequency range: DC up to 50MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PXI Express standard specification Revision 1.0; Integrated x1 Interface with 264MB/s data throughput in zero wait state burst mode; Provides PXI Express Local Bus Interface and supports entire PXI Trigger Bus; Simple integration in PXI Express systems through preconfigured plug-ins (e.g. NI LabView, NI LabWindows, and NI TestStand); Universal solutions for laboratory and production;
SFX/PXIe1149-C	TCK frequency range: DC up to 80MHz on 8 independent TAP’s, TCK step width 250Hz / 1MHz; SPACE™ II-S scan architecture; HYSCAN™ for simultaneous handling of parallel I/O pattern and serial scan pattern; ADYCS™ II (Active Delay Compensation); Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALE™ Technology; Compliant with PXI Express standard specification Revision 1.0; Integrated x1 Interface with 264MB/s data throughput in zero wait state burst mode; Provides PXI Express Local Bus Interface and supports entire PXI Trigger Bus; Simple integration in PXI Express systems through preconfigured plug-ins (e.g. NI LabView, NI LabWindows, and NI TestStand); Universal solutions for laboratory and production;

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SCANFLEX^® TAP Transceiver

• Desktop, Industrial, and Fixture Transceivers;
• Compliant with IEEE1149.1, IEEE1149.4, IEEE1149.6, IEEE1532, JESD71 (STAPL), SVF (Serial Vector Format)
• Can be combined with all available SCANFLEX components (SCANFLEX Controller, SCANFLEX I/O Modules)
• Full software support by JTAG/Boundary Scan development environment SYSTEM CASCON™;
• Guaranteed support of future advancements due to highly flexible, in-field re-programmable system hardware;
• Innovative link technique enables distances between TAP Transceiver and controller to five metres without performance loss;
• Highly flexible front-end with exchangeable (except in industrial transceivers) TAP Interface Cards (TIC) and integrated analog / digital add-on resources;
• Leading system architecture, based on specifically developed technologies (ADYCS™, HYSCAN™, Autodetect, TIC module concept);
• Automatic recognition of transceiver type, number of TICs, and TIC configuration by AutoDetect mechanism;
• Test programs and ISP scripts are cross compatible with all Boundary Scan controllers from GÖPEL electronic;
• Applicable for standard Boundary Scan test, in-system programming (ISP) and in-system configuration (ISC);
• Supports Extended Boundary Scan operations in combination with various other test and programming methodologies;
• Handy, compact units; shipping with appropriate power supply, 2m SFX cable (default), and TAP and PIO cables (except Industrial Transceivers)

Desktop Transceivers
SFX-TAP2	Up to 2 independent TAP's via two TIC slots (default: TIC01) Per TAP programmable parameters Output voltage 1.8 to 4.5 V Input threshold 0 to 3V / 5V tolerant Input and output impedance TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments Single slot for SCANFLEX I/O Module SFX/LS upgrade interface for I/O Modules Universal solution for configuration of stand-alone bench-top systems in laboratory, production and service
SFX-TAP4	Up to 4 independent TAP's via four TIC slots (default: TIC01) Per TAP programmable parameters Output voltage 1.8 to 4.5 V Input threshold 0 to 3V / 5V tolerant Input and output impedance TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments Single slot for SCANFLEX I/O Module SFX/LS upgrade interface for I/O Modules Universal solution for configuration of stand-alone bench-top systems in laboratory, production and service
SFX-TAP6	Up to 6 independent TAP's via six TIC slots (default: TIC01) Per TAP programmable parameters Output voltage 1.8 to 4.5 V Input threshold 0 to 3V / 5V tolerant Input and output impedance TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments Single slot for SCANFLEX I/O Module SFX/LS upgrade interface for I/O Modules Universal solution for configuration of stand-alone bench-top systems in laboratory, production and service
SFX-TAP8	Up to 8 independent TAP's via eight (seven*) TIC slots (default: TIC01) Per TAP programmable parameters Output voltage 1.8 to 4.5 V Input threshold 0 to 3V / 5V tolerant Input and output impedance TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments Two (three*) slot for SCANFLEX I/O Module SFX/LS upgrade interface for I/O Modules 48 V Aux support for SCANFLEX I/O slots Universal solution for configuration of stand-alone bench-top systems in laboratory, production and service
Industrial Transceivers
SFX-TAP2/C	2 independent TAP's via two integrated TIC01 Per TAP programmable parameters Output voltage 1.8 to 4.5 V Input threshold 0 to 3V / 5V tolerant Input and output impedance TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments SFX/LS upgrade interface for I/O Modules SCP bus support Three fully synchronous shadow TDI per TAP Compact interface for TAP and PIO signals (68 pin SCSI-3 style plug connector); Fully backwards compatible to electric interfaces on previous generation Boundary Scan controllers; Industrial solution, in particular for production and integration into Third Party ATE (Flying Prober, Functional Testers,…);
SFX-TAP4/C	4 independent TAP's via four integrated TIC01 Per TAP programmable parameters Output voltage 1.8 to 4.5 V Input threshold 0 to 3V / 5V tolerant Input and output impedance TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments SFX/LS upgrade interface for I/O Modules SCP bus support Compact interface for TAP and PIO signals (68 pin SCSI-3 style plug connector); Industrial solution, in particular for production and integration into Third Party ATE (Flying Prober, Functional Testers,…);
SFX-TAP4/CR	4 relay-coupled, independent TAP's via four integrated TIC01 Per TAP programmable parameters Output voltage 1.8 to 4.5 V Input threshold 0 to 3V / 5V tolerant Input and output impedance TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments SFX/LS upgrade interface for I/O Modules SCP bus support Breaker relays for all TAP and 32 bit PIO Integrated self-test function for TAP and PIO Compact interface for TAP and PIO signals (68 pin SCSI-3 style plug connector); Industrial solution, in particular for production and integration into Third Party ATE (Flying Prober, Functional Testers,…);
Fixture Transceivers
SFX-TAP2/FXT	Up to 2 independent TAP's via two differential TIC slots Exchangeable Line Driver Module (LDM) External differentially coupled TIC Per TAP programmable parameters Output voltage 1.2 to 3.6 V (internal / external) Input threshold 0 to 3V (internal / external) Breaker relays for TAP (TIC02/SR) TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments Single slot for SCANFLEX I/O Module SFX/LS upgrade interface for I/O Modules Flexible front-end with differentially coupled, external TAP Interface Cards (TIC) and integrated add-on resources; Distributed TIC wiring through multiple connectors up to two metres from transceiver without performance loss; Universal solution, in particular for integration into fixture based ATE (ICT, Functional Testers,…);
SFX-TAP4/FXT	Up to 4 independent TAP's via four differential TIC slots Exchangeable Line Driver Module (LDM) External differentially coupled TIC Per TAP programmable parameters Output voltage 1.2 to 3.6 V (internal / external) Input threshold 0 to 3V (internal / external) Breaker relays for TAP (TIC02/SR) TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments Single slot for SCANFLEX I/O Module SFX/LS upgrade interface for I/O Modules Flexible front-end with differentially coupled, external TAP Interface Cards (TIC) and integrated add-on resources; Distributed TIC wiring through multiple connectors up to two metres from transceiver without performance loss; Universal solution, in particular for integration into fixture based ATE (ICT, Functional Testers,…);
SFX-TAP6/FXT	Up to 6 independent TAP's via six differential TIC slots Exchangeable Line Driver Module (LDM) External differentially coupled TIC Per TAP programmable parameters Output voltage 1.2 to 3.6 V (internal / external) Input threshold 0 to 3V (internal / external) Breaker relays for TAP (TIC02/SR) TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments Single slot for SCANFLEX I/O Module SFX/LS upgrade interface for I/O Modules Flexible front-end with differentially coupled, external TAP Interface Cards (TIC) and integrated add-on resources; Distributed TIC wiring through multiple connectors up to two metres from transceiver without performance loss; Universal solution, in particular for integration into fixture based ATE (ICT, Functional Testers,…);
SFX-TAP8/FXT	Up to 8 independent TAP's via eight (seven*) differential TIC slots Exchangeable Line Driver Module (LDM) External differentially coupled TIC Per TAP programmable parameters Output voltage 1.2 to 3.6 V (internal / external) Input threshold 0 to 3V (internal / external) Breaker relays for TAP (TIC02/SR) TDI delay (ADYCS II™) Relay switched output line TCK frequency range DC - 80 MHz Hot Plug feature incl. TAP protection Special add-on resources Dynamic 32 bit PIO with programmable I/O voltage Two analog I/O channels (10 bit ADC/DAC) Static 3 bit PIO for event handling Trigger channels for external instruments Two (three*) slots for SCANFLEX I/O Module SFX/LS upgrade interface for I/O Modules Three separately controllable power relays Flexible front-end with differentially coupled, external TAP Interface Cards (TIC) and integrated add-on resources; Distributed TIC wiring through multiple connectors up to two metres from transceiver without performance loss; Universal solution, in particular for integration into fixture based ATE (ICT, Functional Testers,…);

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SCANFLEX^® I/O Modules

• Can be combined with all available SCANFLEX components (SCANFLEX Controller, SCANFLEX TAP Transceivers)
• Full software support by JTAG/Boundary Scan development environment SYSTEM CASCON™;
• Clustering of SCANFLEX I/O Modules using Multi-Module Carriers (SFX Carrier);
• Innovative link technique enable distances to I/O Modules to five metres without performance loss with up to three trunks;
• Free programming (manual/ATPG) of module functions in mixed signal Boundary Scan programming language CASLAN;
• Guaranteed support of future advancements due to highly flexible, in-field re-programmable system hardware;
• Leading system architecture, based on specifically developed technologies (HYSCAN™, VarioCore™, Autodetect);
• Automatic recognition of SCANFLEX I/O modules by AutoDetect mechanism;
• Applicable for standard Boundary Scan test, in-system programming (ISP) and in-system configuration (ISC);
• Supports Extended Boundary Scan operations in combination with various other test and programming methodologies;
• Control of module functions completely independent of TAP sequences; however, operations can be fully synchronized;
• modular, compact unit with defined standard dimensions, shipping with connection cable;

SFX I/O Modules
SFX-1000 Prototyping Module	Can be 1149.1 TAP synchronized (HYSCAN™); On-board interface CPLD; Programmable functions; Breadboard area for customer-specific circuits; Pin header for individual signal contacting;
SFX-1149.4 Analog Test Bus I/O	IEEE 1149.4 compliant; Can be 1149.1 TAP synchronized (HYSCAN™); 1 x ATAP (AT1, AT2); RLC measuring functions; AC voltage metering; DC voltage metering; Ramp function; Digitizer function;
SFX-5296 Digital I/O Module	Can be 1149.1 TAP synchronized (HYSCAN™); 96 independent, single ended channels; Channels can be configured as In / Out / Bidir / Tristate; 32x3 channels voltage programmable; I/O voltage 1.8 - 4.5 V programmable (5 V tolerant); Hotswap feature; Increased current yield (24mA) per channel; CION™ based I/O protection;
SFX-5350 Differential Digital I/O	Can be 1149.1 TAP synchronized (HYSCAN™); provides 50 bi-directional differential test channels, divided in two groups of 25 channels each; Supported I/O standards: LVDS (2,5 V) and Bus LVDS (2,5 V); Each channel is set up as bi-directional differential buffer (Bus LVDS) in the default configuration; 100 Ohm termination resistor for each channel  through an included adapter (removable): Differential output voltage: 0.25V to 0.45V; Minimum differential input voltage: 0.2V; Output common mode voltage: typ. 1.2V; Input common mode voltage: 0.2V to 2V VarioCore support;
SFX 5704 Mixed-Signal I/O Module	Can be 1149.1 TAP synchronized (HYSCAN™); Four independent mixed signal channels; Channels can be configured as In / Out / Bidir / Tristate; Programmable output voltage ±10V; Programmable input Voltage ±10V; Programmable Pull Up / Pull Down; Programmable driver current (up to 0.3 A); Clipp-circuit (limiter) per channel; 12 bit ADC per channel; Interposing relay for each channel;
SFX-6216 Analog Input Module	Can be 1149.1 TAP synchronized (HYSCAN™); 16 channels based on 4 x 4 multiplexing; 4 times ADC with 12 bit resolution; Scan rate 250 kSample/sec; Programmable measuring range to 50 V; Bipolar inputs; Input impedance > 1 MOhm; External trigger channels; VarioCore™ support;
SFX Carrier
SFX-Carrier 5	Desktop Multi Module Carrier for up to 5 SFX I/O Modules; Each SFX Slot can be 1149.1 TAP synchronized (HYSCAN™); Three separately controllable power relays; Three static digital I/O for event handling; External power supply; 48 V Aux support for SCANFLEX I/O slots; AutoDetect support;
SFX Carrier 10/15	Desktop Multi Module Carrier for up to 10/15 SFX I/O Modules; Integration of 2/3 SFX Carrier 5 in one desktop housing; Each SFX Slot can be 1149.1 TAP synchronized (HYSCAN™); 6/9 separately controllable power relays; 6/9 static digital I/O for event handling; Powered by built-in wide-range power supply; 48 V Aux support for SCANFLEX I/O slots; Optionally, SFX-TAP8 can be plugged in place of a SFX Carrier 5; AutoDetect support;
SFX Carrier 10C/15C	Industrial Multi Module Carrier for up to 10/15 SFX I/O Modules; Integration of 2/3 SFX Carrier 5 in a 3/4 HU 19 inch housing; Pre-configured for rack and stack integration in 19 inch rack based testers; Each SFX Slot can be 1149.1 TAP synchronized (HYSCAN™); 6/9 separately controllable power relays; 6/9 static digital I/O for event handling; Powered by built-in wide-range power supply; 48 V Aux support for SCANFLEX I/O slots; Optionally, SFX-TAP8 can be plugged in place of a SFX Carrier 5; AutoDetect support;

For detailed information about SCANFLEX please contact us.

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