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Market segments Aerospace Automotive Consumer Electronics Contract Manufacturers Industrial Controls Healthcare Electronics Defense Electronics Telecom, Networking Applications IC / device test JTAG validation and BSDL verification Chip-embedded instrumentation PCBA / sub assembly test Prototype verification Structural manufacturing test Automated optical inspection Automated X-ray inspection Conformal Coat Inspection Field service JTAG / boundary scan Processor emulation test In-system programming Serial EEPROM Flash EEPROM CPLD and FPGA System level test Functional test Brands ADYCS CASCON GALAXY CASCON POLARIS CASLAN Chameleon ChipVORX CION FastScale HyScan JULIET OptiCon SCANASSIST SCANBOOSTER SCANFLEX SCANVISION SYSTEM CASCON TAPChecker TOM VarioCORE VarioTAP Virtual Scan Pin Products Automated Optical Inspection systems Automated X-Ray Inspection systems Automotive Test Solutions Chip-embedded instrumentation tools EDA software In-system programming tools JTAG / boundary scan software CASCON GALAXY CASCON POLARIS SCANASSIST SCANVISION JTAG / boundary scan hardware CION PicoTAP SCANBOOSTER SCANFLEX Other JTAG accessories JTAG software and hardware bundle SCANBOOSTER Designer Studio ATE Integration packages JULIET Tester Processor Emulation Test tools General purpose test modules I/O modules Interface modules Power modules Simulation modules Switching modules Turn-key JTAG / boundary scan tester Support Contact Technical Support Contact Sales Support Services BSDL Verification DFT Analysis Technical Support Test Development Services Training GOEPEL GENESIS Event registration e-Bulletin signup Education DFT Guide (blog) GOEPEL Electronics' Blog Downloads DFT Guidelines BSDL SyntaxChecker Tutorials, webinar transcripts and recordings Product information Test technology and standards IEEE 1149.1 IEEE 1149.4 IEEE 1149.6 IEEE 1149.7 IEEE P1149.8.1 IEEE 1450.x IEEE 1500 IEEE 1532 IEEE 1581 IEEE P1687 IEEE P1838 JESD-71 / STAPL SVF In-Circuit Test Flying Probe Test JTAG / boundary scan Other technologies Glossary Upcoming events Webinars Trade shows Seminars Training News News releases Sign up for e-Bulletin Upcoming Events Corporate information About us Survey Contact us Partners Privacy Policy Sitemap

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Market segments  |  Applications  |  GOEPEL brands  |  GOEPEL Products  |  GOEPEL Support  |  Education  |  Corporate information

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Homepage

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Market Segments

Aerospace Automotive Consumer Electronics Contract Manufacturers Industrial Controls Medical Military / Government subcontractors Telecom / Networking

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Applications

IC level test solutions
	JTAG validation and BSDL verification Chip-embedded instrumentation
Board level test and inspection solutions
	Prototype verification and test Structural manufacturing test (JTAG / boundary scan) Automated Optical Inspection Automated X-Ray Inspection Conformal Coat Inspection Field service test and in-system configuration solutions
JTAG / boundary scan solutions
Processor Emulation Test (PET) solutions
In-system programming solutions
	ISP of serial EEPROMs ISP of Flash EEPROM devices ISP of CPLD/FPGA devices
System level test solutions
Functional test solutions

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GOEPEL brands

ADYCS CASCON GALAXY CASCON POLARIS CASLAN

Chameleon CION FastScale HyScan

JULIET OptiCon SCANASSIST

SCANBOOSTER SCANFLEX SCANVISION

SYSTEM CASCON TAP Checker TOM optical inspection systems

VarioCORE VarioTAP Virtual Scan Pin

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GOEPEL products

Automated Optical Inspection
	OptiCon AdvancedLine OptiCon BasicLine OptiCon SmartLine OptiCon TurboLine TOM optical inspection systems
Automated X-Ray Inspection
	OptiCon X-Line - High-speed 3D inline Automated X-ray Inspection
Automotive and Avionics Test Solutions
	CAN solutions Flexray solutions K-Line solutions LIN solutions LVDS solutions MOST solutions
ChipVORX - chip-embedded instrumentation
TAP Checker JTAG / boundary scan validation software
In-system programming solutions
JTAG / boundary scan solutions
Industry-leading JTAG / boundary-scan software
	CASCON GALAXY CASCON POLARIS SCANASSIST - JTAG / boundary-scan debug solutions SCANVISION - Schematic and Layout visualization
Award-winning JTAG / boundary-scan hardware
	CION - Configurable I/O Network PicoTAP SCANBOOSTER SCANFLEX JTAG / boundary scan accessories
Software and hardware bundles for JTAG / boundary scan applications
	SCANBOOSTER Designer Studio JULIET tester ATE integration packages
VarioTAP
JTAG / boundary-scan turn-key solutions
General purpose test modules
	Analog and digital I/O modules Interface test modules PXI power supply modules Load, resistance, and sensor simulation modules PXI switching modules

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Support and services

Technical support Sales support Services offered by GOEPEL Electronics BSDL verification Design for Test (DFT) Analysis Test development Training classes GENESIS support website Upcoming events GOEPEL Electronics e_Bulletin Support Request JTAG / boundary scan system configurator

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Education

GOEPEL Electronics' Blog What is AOI and AXI? Benefits and capabilities of AOI and AXI Design for inspection Design for inspection (DFI) guidelines What is JTAG / boundary scan? Overview of JTAG / boundary scan tools TAP interface connector type and pinout Questions to consider when selecting JTAG / boundary scan tools and services Design for Test Test and inspection technologies JTAG / boundary scan IEEE Std 1149.1 IEEE 1149.4 IEEE Std 1149.6 IEEE Std 1149.7 IEEE P1149.8.1 IEEE Std 1450 IEEE Std 1500 IEEE Std 1532 IEEE Std 1581 IEEE P1687 3D IC test - IEEE P1838 JESD-71 / STAPL Serial Vector Format (SVF) In-circuit test (ICT) Flying probe test (FPT) Glossary

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Download area

DFT, DFI BSDL Syntax Checker Tutorials Product Information Free tools GOEPEL e-Bulletin archive

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GOEPEL Electronics corporate information

Contact form GOEPEL Electronics press release archive About GOEPEL electronics What do you think about GOEPEL electronics ? GOEPEL Electronics' Blog Partners Upcoming events Our Privacy Policy

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